Worst-case and Distributional Robustness Analysis of a Thin Film Deposition Process
Rasoulian, Shabnam, Ricardez-Sandoval, Luis A.Volume:
48
Year:
2015
Language:
english
Journal:
IFAC-PapersOnLine
DOI:
10.1016/j.ifacol.2015.09.119
File:
PDF, 782 KB
english, 2015