Robust rigid registration by scanning multiple phase...

Optik - International Journal for Light and Electron Optics 2015 / 12 Vol. 126; Iss. 24

Robust rigid registration by scanning multiple phase correlation peaks

Alba, Alfonso, Arce-Santana, Edgar R.
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Volume:
126
Language:
english
Journal:
Optik - International Journal for Light and Electron Optics
DOI:
10.1016/j.ijleo.2015.09.125
Date:
December, 2015
File:
PDF, 785 KB
english, 2015
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