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ESD protection for negative charge pump (CP) using CP internal switches
Srivastava, Ankit, Worley, Gene, Quan, Xiaohong, Miao, GuoqingVolume:
57
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2015.12.012
Date:
February, 2016
File:
PDF, 1.12 MB
english, 2016