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A novel testing system based on microprobe and machine vision for IC testing
Wang, Tao, Li, Junhui, Zhu, WenhuiVolume:
127
Language:
english
Journal:
Optik - International Journal for Light and Electron Optics
DOI:
10.1016/j.ijleo.2015.12.125
Date:
April, 2016
File:
PDF, 1.68 MB
english, 2016