Statistical analysis of in-situ...

Philosophical Magazine A 1997 / 12 Vol. 76; Iss. 6

Statistical analysis of in-situ slip lines by atomic force microscopy observations

Coupeau, C., Girard, J. C., Grilhe, J., Lepinoux, J.
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Volume:
76
Language:
english
Journal:
Philosophical Magazine A
DOI:
10.1080/01418619708214219
Date:
December, 1997
File:
PDF, 1.25 MB
english, 1997
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