Temperature and layer thickness dependent in situ...

Synthetic Metals 2016 / 08 Vol. 218

Temperature and layer thickness dependent in situ investigations on epindolidione organic thin-film transistors

Lassnig, R., Striedinger, B., Jones, A.O.F., Scherwitzl, B., Fian, A., Głowacki, E.D., Stadlober, B., Winkler, A.
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Volume:
218
Language:
english
Journal:
Synthetic Metals
DOI:
10.1016/j.synthmet.2016.05.003
Date:
August, 2016
File:
PDF, 4.44 MB
english, 2016
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