Study From Cryogenic to High Temperatures of the High- and...

IEEE Transactions on Electron Devices 2016 / 5 Vol. 63; Iss. 5

Study From Cryogenic to High Temperatures of the High- and Low-Resistance-State Currents of ReRAM Ni–HfO 2 –Si Capacitors

Vaca, Cesar, Gonzalez, Mireia B., Castan, Helena, Garcia, Hector, Duenas, Salvador, Campabadal, Francesca, Miranda, Enrique, Bailon, Luis A.
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Volume:
63
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2016.2546898
Date:
May, 2016
File:
PDF, 1.03 MB
english, 2016
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