Thickness dependence of infrared reflectance of ultrathin metallic films: Influence of quantum confinement
Villagómez, Ricardo, Xiao, MufeiVolume:
127
Language:
english
Journal:
Optik - International Journal for Light and Electron Optics
DOI:
10.1016/j.ijleo.2016.04.048
Date:
August, 2016
File:
PDF, 520 KB
english, 2016