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Experimental characterization of Silicon Drift Detector for X-ray spectrometry: Comparison with theoretical estimation

Shanmugam, M., Acharya, Y.B., Vadawale, S.V., Mazumdar, H.S.
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Language:
english
Journal:
Measurement
DOI:
10.1016/j.measurement.2016.05.042
Date:
May, 2016
File:
PDF, 843 KB
english, 2016
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