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Generation and application of bessel beams in electron microscopy
Grillo, Vincenzo, Harris, Jérémie, Gazzadi, Gian Carlo, Balboni, Roberto, Mafakheri, Erfan, Dennis, Mark R., Frabboni, Stefano, Boyd, Robert W., Karimi, EbrahimVolume:
166
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2016.03.009
Date:
July, 2016
File:
PDF, 1.56 MB
english, 2016