A study on the competition between bias-induced charge trapping and light-induced instability in In-Ga-Zn-O thin-film transistors
Park, Jozeph, Trung, Nguyen Dinh, Kim, Yang Soo, Kim, Jong Heon, Park, Kyung, Kim, Hyun-SukVolume:
36
Language:
english
Journal:
Journal of Electroceramics
DOI:
10.1007/s10832-016-0032-3
Date:
June, 2016
File:
PDF, 516 KB
english, 2016