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Optical examination of high contrast grating fabricated by focused-ion beam etching
Urbańczyk, Dominika, Wójcik-Jedlińska, Anna, Muszalski, Jan, Łaszcz, Adam, Płuska, Mariusz, Gębski, Marcin, Czyszanowski, Tomasz, Czerwinski, Andrzej, Bugajski, MaciejVolume:
48
Language:
english
Journal:
Optical and Quantum Electronics
DOI:
10.1007/s11082-016-0544-8
Date:
April, 2016
File:
PDF, 1.36 MB
english, 2016