Fatigue life estimation of vertical probe needle for wafer probing
Shin, Bonghun, Kwon, Hyock-Ju, Han, Sang-Wook, Im, Chang MinVolume:
16
Language:
english
Journal:
International Journal of Precision Engineering and Manufacturing
DOI:
10.1007/s12541-015-0322-8
Date:
November, 2015
File:
PDF, 716 KB
english, 2015