The estimation of surface roughness with the utilization of...

Infrared Physics & Technology 2016 / 05 Vol. 76

The estimation of surface roughness with the utilization of Mueller matrix

Yang, Wei, Gu, Guohua, Zhou, Xiaojun, Xu, Fuyuan, Ren, Kan
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Volume:
76
Language:
english
Journal:
Infrared Physics & Technology
DOI:
10.1016/j.infrared.2016.04.031
Date:
May, 2016
File:
PDF, 1.80 MB
english, 2016
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