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Accuracy evaluation of an X-ray microtomography system
Fernandes, Jaquiel S., Appoloni, Carlos R., Fernandes, Celso P.Volume:
85
Language:
english
Journal:
Micron
DOI:
10.1016/j.micron.2016.03.007
Date:
June, 2016
File:
PDF, 1.54 MB
english, 2016