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A 72% error reduction scheme based on temperature acceleration for long-term data storage applications: Cold flash and millennium memories
Yamazaki, Senju, Iwasaki, Tomoko Ogura, Hachiya, Shogo, Takahashi, Tomonori, Takeuchi, KenVolume:
121
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2016.03.009
Date:
July, 2016
File:
PDF, 1.59 MB
english, 2016