Back-of-the-envelope miniload throughput bounds and...

Back-of-the-envelope miniload throughput bounds and approximations

FOLEY, ROBERT D., HACKMAN, STEVEN T., PARK, BYUNG CHUN
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Volume:
36
Language:
english
Journal:
IIE Transactions
DOI:
10.1080/07408170490274232
Date:
March, 2004
File:
PDF, 258 KB
english, 2004
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