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Studies of ferroelectric film growth processes using in situ, real-time ion beam analysis
Krauss, A. R., Auciello, O., Im, J., Smentkowski, V., Gruen, D. M., Irene, E. A., Chang, R. P. H.Volume:
18
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584589708221712
Date:
September, 1997
File:
PDF, 824 KB
english, 1997