[IEEE 2016 IEEE NW Russia Young Researchers in Electrical and Electronic Engineering Conference (EIConRusNW) - Saint Petersburg, Russia (2016.2.2-2016.2.3)] 2016 IEEE NW Russia Young Researchers in Electrical and Electronic Engineering Conference (EIConRusNW) - Increasing methodology of the reliability of the data signals based on technical diagnostics
Ye, Kyaw Zaw, Lin, Kyaw Zin, Mikalovich, Portnov Evgeni, Ivanovich, Lisov Olev, San, KaungYear:
2016
Language:
english
DOI:
10.1109/eiconrusnw.2016.7448198
File:
PDF, 226 KB
english, 2016