[IEEE 2010 International Conference on Measuring Technology...

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[IEEE 2010 International Conference on Measuring Technology and Mechatronics Automation (ICMTMA 2010) - Changsha City, China (2010.03.13-2010.03.14)] 2010 International Conference on Measuring Technology and Mechatronics Automation - Effect of Heat-Treated Microstructure on the Polishing Performance for 3Cr17NiMo Plastic Die Steel

Wan, Nong, Zhou, You, Fu, Xiangkui, Zheng, Xiao
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Year:
2010
Language:
english
DOI:
10.1109/icmtma.2010.118
File:
PDF, 648 KB
english, 2010
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