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[IEEE 2012 IEEE International Conference on Microelectronic Test Structures (ICMTS) - San Diego, CA, USA (2012.03.19-2012.03.22)] 2012 IEEE International Conference on Microelectronic Test Structures - Session 10: Capacitance
Verzi, Bill, Toffoli, AlainYear:
2012
DOI:
10.1109/icmts.2012.6190655
File:
PDF, 19 KB
2012