[IEEE 2016 International Conference on Microelectronic Test Structures (ICMTS) - Yokohama, Japan (2016.3.28-2016.3.31)] 2016 International Conference on Microelectronic Test Structures (ICMTS) - Session 8: Non-volatile memories
Schmitz, Jurriaan, Habu, SatoshiYear:
2016
DOI:
10.1109/icmts.2016.7476192
File:
PDF, 141 KB
2016