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[IEEE 2015 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2015.12.7-2015.12.9)] 2015 IEEE International Electron Devices Meeting (IEDM) - Physics-based compact modeling framework for state-of-the-art and emerging STT-MRAM technology
Xu, Nuo, Wang, Jing, Lu, Yang, Park, Hong-Hyun, Fu, Bo, Chen, Renyu, Choi, Woosung, Apalkov, Dmytro, Lee, Sungchul, Ahn, Sungmin, Kim, Yohan, Nishizawa, Yutaka, Lee, Keun-Ho, Park, Youngkwan, Jung, EuYear:
2015
Language:
english
DOI:
10.1109/iedm.2015.7409789
File:
PDF, 1.52 MB
english, 2015