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[IEEE 2016 17th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2016.3.15-2016.3.16)] 2016 17th International Symposium on Quality Electronic Design (ISQED) - Device/system performance modeling of stacked lateral NWFET logic
Victor Huang,, Pan, Chenyun, Yakimets, Dmitry, Raghavan, Praveen, Naeemi, AzadYear:
2016
Language:
english
DOI:
10.1109/isqed.2016.7479203
File:
PDF, 549 KB
english, 2016