X-Ray Diffractometry with Low Power Microfocus Sources –...

X-Ray Diffractometry with Low Power Microfocus Sources – New Possibilities in the Lab

Jörg Wiesmann, Jürgen Graf, Christian Hoffmann, Alexandra Hembd, Carsten Michaelsen, Ning Yang, Holger Cordes, Bob He, Uwe Preckwinkel, Kurt Erlacher
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Volume:
26
Year:
2009
Language:
english
Pages:
5
DOI:
10.1002/ppsc.200800052
File:
PDF, 348 KB
english, 2009
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