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[IEEE International Test Conference, 2003. ITC 2003. - Washington, DC, USA (Sept. 30-Oct. 2, 2003)] International Test Conference, 2003. Proceedings. ITC 2003. - Mems manufacturing testing: an accelerometer case study
Maudie, T., Hardt, A., Nielsen, R., Stanerson, D., Bleschke, R., Miller, M.Volume:
1
Year:
2003
Language:
english
DOI:
10.1109/test.2003.1271069
File:
PDF, 725 KB
english, 2003