[IEEE 2007 IEEE International Test Conference - Santa...

  • Main
  • [IEEE 2007 IEEE International Test...

[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - At-speed scan tests: Reality or fantasy?

Dhiraj Goswami,, Nilanjan Mukherjee,
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2007
Language:
english
DOI:
10.1109/test.2007.4437667
File:
PDF, 102 KB
english, 2007
Conversion to is in progress
Conversion to is failed