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[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - At-speed scan tests: Reality or fantasy?
Dhiraj Goswami,, Nilanjan Mukherjee,Year:
2007
Language:
english
DOI:
10.1109/test.2007.4437667
File:
PDF, 102 KB
english, 2007