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[IEEE 2016 IEEE 34th VLSI Test Symposium (VTS) - Las Vegas, NV, USA (2016.4.25-2016.4.27)] 2016 IEEE 34th VLSI Test Symposium (VTS) - Test-point insertion efficiency analysis for LBIST applications
He, Miao Tony, Contreras, Gustavo K., Tehranipoor, Mark, Tran, Dat, Winemberg, LeRoyYear:
2016
Language:
english
DOI:
10.1109/vts.2016.7477314
File:
PDF, 260 KB
english, 2016