Multi-qubit joint measurements in circuit QED: stochastic...

EPJ Quantum Technology 2016 / 12 Vol. 3; Iss. 1

Multi-qubit joint measurements in circuit QED: stochastic master equation analysis

Criger, Ben, Ciani, Alessandro, DiVincenzo, David P
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Volume:
3
Language:
english
Journal:
EPJ Quantum Technology
DOI:
10.1140/epjqt/s40507-016-0044-6
Date:
December, 2016
File:
PDF, 1.81 MB
english, 2016
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