Analysis of velocity-mapped ion images from high-resolution crossed-beam scattering experiments: a tutorial review
Zastrow, Alexander von, Onvlee, Jolijn, Parker, David H., van de Meerakker, Sebastiaan Y.T.Volume:
2
Language:
english
Journal:
EPJ Techniques and Instrumentation
DOI:
10.1140/epjti/s40485-015-0020-z
Date:
December, 2015
File:
PDF, 3.63 MB
english, 2015