Improving Accuracy of Sample Surface Topography by Atomic...

Journal of Nanoscience and Nanotechnology 2009 / 10 Vol. 9; Iss. 10

Improving Accuracy of Sample Surface Topography by Atomic Force Microscopy

Xu, Mingsheng, Fujita, Daisuke, Onishi, Keiko, Miyazawa, Kunichi
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Volume:
9
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2009.1232
Date:
October, 2009
File:
PDF, 5.87 MB
english, 2009
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