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Removal of multiple-tip artifacts from scanning tunneling microscope images by crystallographic averaging
Straton, Jack C., Moon, Bill, Bilyeu, Taylor T., Moeck, PeterVolume:
1
Language:
english
Journal:
Advanced Structural and Chemical Imaging
DOI:
10.1186/s40679-015-0014-6
Date:
December, 2015
File:
PDF, 1.95 MB
english, 2015