Determination of Free Electron Density in Sequentially...

Applied Spectroscopy 2015 / 02 Vol. 69; Iss. 2

Determination of Free Electron Density in Sequentially Doped InxGa1−xAs by Raman Spectroscopy

Kort, Kenneth R., Hung, P.Y., Loh, Wei-Yip, Bersuker, Gennadi, Banerjee, Sarbajit
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Volume:
69
Language:
english
Journal:
Applied Spectroscopy
DOI:
10.1366/14-07602
Date:
February, 2015
File:
PDF, 289 KB
english, 2015
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