Defect classification in two-layer complex structures based...

Defect classification in two-layer complex structures based on spectrum analysis of pulsed eddy current

Hu, Xiangchao, He, Yunze, Luo, Feilu
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Volume:
53
Language:
english
Journal:
Insight - Non-Destructive Testing and Condition Monitoring
DOI:
10.1784/insi.2011.53.3.146
Date:
March, 2011
File:
PDF, 5.25 MB
english, 2011
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