Defect classification in two-layer complex structures based on spectrum analysis of pulsed eddy current
Hu, Xiangchao, He, Yunze, Luo, FeiluVolume:
53
Language:
english
Journal:
Insight - Non-Destructive Testing and Condition Monitoring
DOI:
10.1784/insi.2011.53.3.146
Date:
March, 2011
File:
PDF, 5.25 MB
english, 2011