SPIE Proceedings [SPIE Speckle 2010 - Florianapolis, Brazil (Monday 13 September 2010)] Speckle 2010: Optical Metrology - Digital color holography using a stack of photodiodes
Tankam, P., Albertazzi Goncalves, Jr., Armando, Kaufmann, Guillermo H., Picart, P., Mounier, D., Desse, J. M., Li, J. C.Volume:
7387
Year:
2010
Language:
english
DOI:
10.1117/12.870747
File:
PDF, 711 KB
english, 2010