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Parratt-Based and Model-Independent X-ray Reflectivity Fitting Procedure for Nanoscale Thin Film Characterization
Yu, Chung-Jong, Kim, Euikwoun, Kim, Jae-YongVolume:
11
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2011.3689
Date:
May, 2011
File:
PDF, 279 KB
english, 2011