[IEEE 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Kosice, Slovakia (2016.4.20-2016.4.22)] 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Comparison of gate-driven and bulk-driven current mirror topologies
Rakus, Matej, Stopjakova, Viera, Arbet, DanielYear:
2016
Language:
english
DOI:
10.1109/DDECS.2016.7482457
File:
PDF, 601 KB
english, 2016