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[IEEE 2016 IEEE Optical Interconnects Conference (OI) - San Diego, CA, USA (2016.5.9-2016.5.11)] 2016 IEEE Optical Interconnects Conference (OI) - Spatial pattern analysis of process variations in silicon microring modulators
Wu, Rui, Chen, Chin-Hui, Huang, Tsung-Ching, Beausoleil, Ray, Cheng, Kwang-TingYear:
2016
Language:
english
DOI:
10.1109/OIC.2016.7482978
File:
PDF, 633 KB
english, 2016