Analysis of SRAM-Based FPGA SEU Sensitivity to Combined EMI...

IEEE Transactions on Nuclear Science 2016 / 4 Vol. 63; Iss. 2

Analysis of SRAM-Based FPGA SEU Sensitivity to Combined EMI and TID-Imprinted Effects

Benfica, Juliano, Green, Bruno, Porcher, Bruno C., Poehls, Leticia Bolzani, Vargas, Fabian, Medina, Nilberto H., Added, Nemitala, de Aguiar, Vitor A. P., Macchione, Eduardo L. A., Aguirre, Fernando, S
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Volume:
63
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2016.2523458
Date:
April, 2016
File:
PDF, 1.20 MB
english, 2016
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