Profile Uniformity of Overlapped Oxide Dots Induced by...

Journal of Nanoscience and Nanotechnology 2011 / 01 Vol. 11; Iss. 1

Profile Uniformity of Overlapped Oxide Dots Induced by Atomic Force Microscopy: (Journal of Nanoscience and Nanotechnology, Vol. 10, pp. 4390–4399 (2010))

Tseng, Ampere A., Notargiacomo, Andrea, Chen, T. P., Liu, Yuchan
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Volume:
11
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2011.3845
Date:
January, 2011
File:
PDF, 1.10 MB
english, 2011
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