[IEEE 2016 Annual Reliability and Maintainability Symposium (RAMS) - Tucson, AZ, USA (2016.1.25-2016.1.28)] 2016 Annual Reliability and Maintainability Symposium (RAMS) - A risk based methodology for managing material/product life cycle disruptions
Clay, William, Morrison, James R., Wolff, Francis, Weyer, Daniel J., Ghosh, Biman, Yellamati, David D.Year:
2016
Language:
english
DOI:
10.1109/rams.2016.7448060
File:
PDF, 260 KB
english, 2016