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Dielectric properties of bismuth niobate films using LaNiO3 bottom electrode
Goncalves, L. F., Rocha, L. S. R., Silva, C. C., Cortés, J. A., Ramirez, M. A., Simões, A. Z.Volume:
27
Language:
english
Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-015-4103-z
Date:
March, 2016
File:
PDF, 1.13 MB
english, 2016