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Feedback from operational experience of on-site deployment of bias defect analysis with COMPUCEA
Berlizov, Andrey, Schachinger, Andreas, Roetsch, Klaus, Erdmann, Nicole, Schorlé, Helene, Vargas, Martin, Zsigrai, Jozsef, Kulko, Aleksandr, Keselica, Miroslav, Caillou, Fabien, Unsal, Volkan, WalczakVolume:
307
Language:
english
Journal:
Journal of Radioanalytical and Nuclear Chemistry
DOI:
10.1007/s10967-015-4364-2
Date:
March, 2016
File:
PDF, 841 KB
english, 2016