[IEEE 2015 International Conference on IC Design & Technology (ICICDT) - Leuven, Belgium (2015.6.1-2015.6.3)] 2015 International Conference on IC Design & Technology (ICICDT) - Through silicon via to FinFET noise coupling in 3-D integrated circuits
Abadi, A. Rouhi Najaf, Guo, W., Sun, X., Ben Ali, K., Raskin, J. P, Rack, M., Neve, C. Roda, Choi, M., Moroz, V., Van der Plas, G., De Wolf, I., Beyne, E., Absil, P.Year:
2015
Language:
english
DOI:
10.1109/icicdt.2015.7165916
File:
PDF, 948 KB
english, 2015