![](/img/cover-not-exists.png)
[IEEE 2016 International Conference on Microelectronic Test Structures (ICMTS) - Yokohama, Japan (2016.3.28-2016.3.31)] 2016 International Conference on Microelectronic Test Structures (ICMTS) - An efficient method to evaluate 4 million micro-bump interconnection resistances for 3D stacked 16-mpixel image sensor
Takemoto, Yoshiaki, Kato, Hideki, Kondo, Torn, Takazawa, Naohiro, Tsukimura, Mitsuhiro, Saito, Haruhisa, Kobayashi, Kenji, Aoki, Jun, Suzuki, Shunsuke, Gomi, Yuichi, Matsuda, Seisuke, Tadaki, YoshitakYear:
2016
Language:
english
DOI:
10.1109/icmts.2016.7476162
File:
PDF, 10.02 MB
english, 2016