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In-Operando Spatial Imaging of Edge Termination Electric Fields in GaN Vertical p-n Junction Diodes
Leonard, Francois, Dickerson, J. R., King, M. P., Armstrong, A. M., Fischer, A. J., Allerman, A. A., Kaplar, R. J., Talin, A. AlbertYear:
2016
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2016.2561838
File:
PDF, 696 KB
english, 2016