Analysis of X-ray diffraction curves of trapezoidal Si nanowires with a strain distribution
Takeuchi, Teruaki, Tatsumura, Kosuke, Shimura, Takayoshi, Ohdomari, IwaoVolume:
612
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2016.05.047
Date:
August, 2016
File:
PDF, 1.79 MB
english, 2016