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Neural Network Method to Model Nanoscale MOSFET Characteristics
Fang, Ming, He, Jin, Zhang, Xukai, Ma, Yong, Chen, Qin, Ye, Yun, Wang, Cheng, Liang, HailangVolume:
9
Language:
english
Journal:
Journal of Computational and Theoretical Nanoscience
DOI:
10.1166/jctn.2012.2611
Date:
December, 2012
File:
PDF, 1.11 MB
english, 2012