Empirical Mode Decomposition for infrared thermography

Insight - Non-Destructive Testing and Condition Monitoring 2006 / 08 Vol. 48; Iss. 8

Empirical Mode Decomposition for infrared thermography

yu-peng, Tian, ke-yin, zhou, Ji-juan,, sheng-lin, Yu
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Volume:
48
Language:
english
Journal:
Insight - Non-Destructive Testing and Condition Monitoring
DOI:
10.1784/insi.2006.48.8.477
Date:
August, 2006
File:
PDF, 1.15 MB
english, 2006
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