On the limitation of dual-view triangulation in reducing the measurement error induced by the speckle noise in scanning operations
Ibaraki, Soichi, Kitagawa, Yoshitomo, Kimura, Yoshihiro, Nishikawa, ShizuoLanguage:
english
Journal:
The International Journal of Advanced Manufacturing Technology
DOI:
10.1007/s00170-016-8787-x
Date:
April, 2016
File:
PDF, 812 KB
english, 2016